A continued investigation into semiconductor devices from the previous module:
A more in-depth analysis into the operation of BJTs and MOSFETs
While we will examine each of the two transistors separately, we will cover the same four topics for each:
Regions of operation
Control mechanism (current or voltage)
Equations and models
Simple circuits using the transistors
A discussion of how many transistors can be manufactured in an integrated circuit
An introduction of Moore's Law, which predicts the rate (and limits) of continued integration in semiconductor components
5. Advanced Power Dissipation and TRANSIENT Thermal Analysis
A continued discussion of the advanced concepts related to power dissipation in semiconductor devices including:
The corollary between electrical parameters (voltage difference, current, electrical resistance and electrical capacitance) and thermal parameters (temperature difference, dissipated power, thermal resistance, and thermal capacitance)
Developing the RC models that can be used for thermal analysis
An introduction of the Zth diagram, how it is used, and perform transient thermal calculations
An introduction of analyzing complex power waveforms by applying the superposition principle
6. MOSFETs, High Side Drivers and Low Side Drivers
This course covers the Metal Oxide Semiconductor Field Effect Transistor (MOSFET) in two different applications–high side drive and low side drive applications. We will discuss:
MOSFET basics
Various driver topologies and how the MOSFET can be used as a solid state driver
The topics of protected high side and low side drivers
How a MOSFET is selected for driver applications
How the minimum on state resistance (Rdson) of a MOSFET is determined for both static and switching applications
The two special MOSFET driver applications
The problems associated with driving both capacitive load and inductive loads
An introduction to the concept of "protected" MOSFET low side drivers (HITFETs):
A quick review of MOSFETs, and how a protected MOSFET low side driver differs from standard transistors
An introduction to the various types of protection that are available in protected low side drivers and the various diagnostic options available in protected MOSFET low side drivers.
Learn how a protected MOSFET low side driver can be easily implemented in an application.
Examine what EMI issues may arise and how they can be minimized and identify how the functionality of the protected MOSFET low side driver can be improved with the addition of a few external components.
Review what questions a system designer should ask when implementing a protected MOSFET low side driver in an application.
An overview of voltage regulation and surveying various types of power supplies:
"What is a power supply?" An introduction to two broad categories of voltage regulator power supplies–linear regulators and switching regulators, followed by details on each of these categories individually.
Develop a simple functional diagram to explain the operation of a linear regulator.
Examine the characteristics and auxiliary functions of linear regulators and briefly examine the different types of switching voltage regulators.
An introduction of the characteristics unique to switching voltage regulators.
When should a designer use a linear or switching regulator?
Learn in detail, the use and operation of switching voltage regulators.
A quick review of power supplies and conversion efficiency.
Differences in the operation of linear voltage regulators and switching voltage regulators.
Different types of switching voltage regulators.
Examine the operation of one of the most common switching voltage regulators, the voltage step down (buck) switching voltage regulator. We will begin with a high-level overview of the operation, and then perform an intensive, step-by-step analysis of its workings.
Examine the variables that go into tailoring a switching voltage regulator for each application, including the performance, size, and cost tradeoffs important to switching regulator design.
11. Electrostatic Discharge, Electrical Over Stress, and Safe Operating Areas
Examine some of the most common causes of semiconductor device failure and ways to address these problems.
An introduction to electrostatic discharge (ESD). We will discuss what ESD is and how it can damage semiconductor components. We will examine what integrated circuit designers can do to reduce the probability of ESD damage, and also what can be done on the system level.
Learn about electrical over stress (EOS) and how it differs from ESD. We will examine common failure modes from EOS and show how these failures modes are distinct from typical ESD damage.
What is a safe operating area (SOA)? The SOA is usually specified within a semiconductor datasheet. Strict adherence to operating a semiconductor device with its SOA will make every designer's life easier.
